LEE, M.-C. A Novel Investigation Method for the S21 Detection Circuit. International Journal of Engineering and Technology Innovation, [S. l.], v. 10, n. 4, p. 252–262, 2020. DOI: 10.46604/ijeti.2020.6262. Disponível em: https://ojs.imeti.org/index.php/IJETI/article/view/6262. Acesso em: 23 nov. 2024.